Measurement of Operational Amplifier Characteristics in the Frequency Domain

IEEE Transactions on Instrumentation and Measurement

Volumn 34, Issue 1, 1985, Pages 59-64

  Sansen, Willy M C ^a   Steyaert, Michael ^a   Vandeloo, Paul J V ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

FREQUENCY DOMAIN MEASUREMENTS;

AMPLIFIERS, OPERATIONAL;

EID: 0022028089     PISSN: 00189456     EISSN: 15579662     Source Type: Journal    
DOI: 10.1109/TIM.1985.4315257     Document Type: Article

References (10)

1. Analog Devices, Appl. Notes, vol. 1, pp. 21–9.
2. Analog Devices, Analog Circuit Design Sem., Apr. 1982.
3. Burr-Brown, “Check five opamp specs in one test,” Appl. Note, Sept. 1973.
4. J. Okun and P. Gantt, “Use loop testing to check differential amps,” EDN, pp. 127–130, June 9, 1983.
5. Linear Integrated Circuits, Motorola Semiconductors, 1981–82.
6. RCA-Linear, Integrated Circuits, 78.
7. Gray and Meyer, Analysis and Design of Analog Analog Integrated Circuits. New York: Wiley, 1977.
8. S. Stas and M. Steyaert, “Modelleren van operationele versterkers in frequentie- en tijdsdomain”, M.S. thesis, K.U. Leuven, 1983, (in Dutch).
9. J. Solomon, “The monolithic opamp: A tutorial study,” IEEE J. Solid-State Circuits, vol. SC-9, p. 314–332, Dec. 74.
10. C. Chuang “Analysis of the settling behavior of an operational amplifier,” IEEE J. Solid-State Circuits, vol. SC-17, pp. 74–80, Feb. 1982.