Material Characterization by Line-Focus-Beam Acoustic Microscope

IEEE Transactions on Sonics and Ultrasonics

Volumn 32, Issue 2, 1985, Pages 189-212

  Kushibiki, Jun Ichi ^a   Chubachi, Noriyoshi ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC IMAGING; MICROSCOPES;

LINE-FOCUS-BEAM ACOUSTIC MICROSCOPE; MATERIAL CHARACTERIZATION;

MATERIALS;

EID: 0022027260     PISSN: 00189537     EISSN: None     Source Type: Journal    
DOI: 10.1109/T-SU.1985.31586     Document Type: Article

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