TRANSIENT CAPACITANCE MEASUREMENTS ON NEUTRON IRRADIATED GALLIUM ARSENIDE.

Volumn , Issue , 1985, Pages 981-987

  Magno, R ^a   Spencer, M ^a   Giessner, J G ^a   Weber, E R ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD EFFECTS; NEUTRONS; SEMICONDUCTING GALLIUM ARSENIDE - RADIATION EFFECTS; SEMICONDUCTOR MATERIALS - DEFECTS; SPECTROSCOPY, ELECTRON;

DEEP LEVEL TRANSIENT SPECTROSCOPY; NEUTRON IRRADIATION DEFECTS; SCHOTTKY BARRIER SAMPLES;

ELECTRIC MEASUREMENTS;

EID: 0021788055     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)