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Volumn 11, Issue 2, 1985, Pages 93-108

An improved top-down algorithm combined with modularization as a highly efficient method for fault tree analysis

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL STATISTICS; RELIABILITY;

EID: 0021787757     PISSN: 01438174     EISSN: None     Source Type: Journal    
DOI: 10.1016/0143-8174(85)90049-6     Document Type: Article
Times cited : (18)

References (8)
  • 4
    • 84887286624 scopus 로고
    • A modular approach to fault tree and reliability analysis
    • Cambridge, Massachusetts
    • (1977) MITNE-209
    • Olmos1    Wolf2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.