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Volumn 32, Issue 1, 1985, Pages 2-6

A New Vertical Power MOSFET Structure with Extremely Reduced On-Resistance

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC MEASUREMENTS - RESISTANCE; ION BEAMS - APPLICATIONS; SEMICONDUCTOR MATERIALS - ETCHING;

EID: 0021787429     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1985.21900     Document Type: Article
Times cited : (93)

References (12)
  • 1
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    • I. Yoshida et al., “Thermal stability and secondary breakdown in planar power MOSFET’s”, IEEE Trans. Electron Devices, vol. ED-27, no. 2, pp. 395–398, Feb. 1980.
    • (1980) IEEE Trans. Electron Devices , vol.ED-27 , Issue.2 , pp. 395-398
    • Yoshida, I.1
  • 2
    • 0018986051 scopus 로고
    • A high-performance planar power MOSFET
    • R. W. Cohen, D. W. Tsand, and K. P. Lisiak, “A high-performance planar power MOSFET”, IEEE Trans. Electron Devices, vol. ED-27, 27, no. 2, pp. 340–342, Feb. 1980.
    • (1980) IEEE Trans. Electron Devices , vol.ED-27 , Issue.27 , pp. 340-342
    • Cohen, R.W.1    Tsand, D.W.2    Lisiak, K.P.3
  • 3
    • 0020171418 scopus 로고
    • Low input capacitance and low Loss VDMOSFET FET rectifier element
    • Y. Shimada et al., “Low input capacitance and low Loss VDMOSFET FET rectifier element”, IEEE Trans. Electron Devices, vol. ED-29, 29, no. 8, pp. 1332–1334, Aug, 1982.
    • (1982) IEEE Trans. Electron Devices , vol.ED-29 , Issue.29 , pp. 1332-1334
    • Shimada, Y.1
  • 4
    • 0018985713 scopus 로고
    • Modeling of on-resistance of LDMOS, VDMOS, and VMOS power transistors
    • S. C. Sun and J. D. Plummer, “Modeling of on-resistance of LDMOS, VDMOS, and VMOS power transistors”, IEEE Trans. Electron Devices, vol. ED-27,1980.
    • (1980) IEEE Trans. Electron Devices , vol.ED-27
    • Sun, S.C.1    Plummer, J.D.2
  • 5
    • 33947678860 scopus 로고
    • Reactive ion beam etching of Si02 and polycrystalline silicon
    • D. M. Brown and B. A. Heath, “Reactive ion beam etching of Si02 and polycrystalline silicon”, J. Appl Phys. Lett., vol. 37, no. 15, 159–161, July 1980.
    • (1980) J. Appl Phys. Lett. , vol.37 , Issue.15 , pp. 159-161
    • Brown, D.M.1    Heath, B.A.2
  • 6
    • 84916381677 scopus 로고
    • A 600-V MOSFET with near ideal ox-resistance
    • V. A. K. Temple and R. P. Love, “A 600-V MOSFET with near ideal ox-resistance”, in IEDM Tech. Dig. pp. 664-666,1978.
    • (1978) IEDM Tech. Dig. , pp. 664-666
    • Temple, V.A.K.1    Love, R.P.2
  • 7
    • 0018030083 scopus 로고
    • Fabrication of novel three-dimensional micro structures by the anisotropic etching of (100) and (110) silicon
    • E. Bassous, “Fabrication of novel three-dimensional micro structures by the anisotropic etching of (100) and (110) silicon”, IEEE. Trans. Electron Devices, vol. ED-25, no. 10, pp. 1178–1185, 1185, Oct. 1978.
    • (1978) IEEE. Trans. Electron Devices , vol.ED-25 , Issue.10 , pp. 1178-1185
    • Bassous, E.1
  • 8
    • 0021410080 scopus 로고
    • A new vertical double dif-fused MOSFET-The self-aligned terraced-gate MOSFET
    • D. Ueda, H. Takagi, and G. Kano, “A new vertical double dif-fused MOSFET-The self-aligned terraced-gate MOSFET”, IEEE Trans. Electron Devices, vol. ED-31, no. 4, pp. 416–420, Apr. 1984.
    • (1984) IEEE Trans. Electron Devices , vol.ED-31 , Issue.4 , pp. 416-420
    • Ueda, D.1    Takagi, H.2    Kano, G.3
  • 9
    • 0001635735 scopus 로고
    • The mechanism of self-healing electrical breakdown in MOS structure
    • N. Klein, “The mechanism of self-healing electrical breakdown in MOS structure”, IEEE Trans. Electron Devices, vol. ED-13, no. 11, 788–805, Nov. 1966.
    • (1966) IEEE Trans. Electron Devices , vol.ED-13 , Issue.11 , pp. 788-805
    • Klein, N.1
  • 10
    • 0018038179 scopus 로고
    • Trade off be-tween threshold voltage and breakdown in high voltage double-diffused diffused MOS transistors
    • M. D. Pocha, J. D. Plummer, and J. D. Meindl, “Trade off be-tween threshold voltage and breakdown in high voltage double-diffused diffused MOS transistors”, IEEE Trans. Electron Devices, vol. ED-25, no. 11, pp. 1325–1327, Nov. 1978.
    • (1978) IEEE Trans. Electron Devices , vol.ED-25 , Issue.11 , pp. 1325-1327
    • Pocha, M.D.1    Plummer, J.D.2    Meindl, J.D.3
  • 12
    • 0019248558 scopus 로고
    • 2-D analysis of negative resistance region of vertical power MOSFET
    • A. Wieder, C. Werner, and J. Tihanyi, “2-D analysis of negative resistance region of vertical power MOSFET”, in IEDM Tech. Dig., p. 95,1980.
    • (1980) IEDM Tech. Dig. , pp. 95
    • Wieder, A.1    Werner, C.2    Tihanyi, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.