Design of Universal Test Sequences for VLSI

IEEE Transactions on Information Theory

Volumn 31, Issue 1, 1985, Pages 10-17

  Lempel, Abraham ^a   Cohn, Martin ^b  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^b BRANDEIS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT TESTING;

UNIVERSAL TEST SEQUENCES;

INTEGRATED CIRCUITS, VLSI;

EID: 0021785316     PISSN: 00189448     EISSN: 15579654     Source Type: Journal    
DOI: 10.1109/TIT.1985.1057003     Document Type: Article

References (7)

1. M. Cohn and A. Lempel, “Minimum diagnostic M-sequences for multioutput circuits,” Sperry Research Center Rep. SRC-RR-80-67, Oct. 1980.
2. M. O. Rabin, “Fingerprinting by random polynomial,” Aiken Comp. Lab. Rep., TR-15-81, Harvard Univ., Cambridge, MA 02138.
3. S. W. Golomb, Shift Register Sequences, San Francisco: Holden Day, 1967.
4. A. Lempel, “Matrix factorization over GF(2) and trace-orthogonal bases of GF(2 n),” SIAM J. Comput., vol. 4, no. 2, pp. 175–186.
5. A. Lempel, “Analysis and synthesis of polynomials and sequences over GF(2),” IEEE Trans. Inform. Theory, vol. IT-17, pp. 297–303, May 1971.
6. Z. Barzilai, D. Coopersmith, and A. L. Rosenberg, “Exhaustive bit pattern generation in discontiguous positions, with applications to VLSI self-testing,” RC 8750 (no. 38299), IBM T. J. Watson Research Center, Mar. 19, 1981; IEEE Trans. Comput., vol. C-32, pp. 190–194, Feb. 1983.
7. P. V. Kumar and R. A. Scholtz, “Bounds on the linear span of bent sequences,” IEEE Trans. Inform. Theory, vol. IT-29, pp. 854–862, Nov. 1983.