EFFECTS OF SURFACE ROUGHNESS IN INVERSION LAYER TRANSPORT.

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1984, Pages 605-608

  Ferry, D K ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR DEVICES, MOS;

INVERSION LAYERS; MOS DEVICES; ROUGH SURFACES;

SEMICONDUCTING SILICON;

INVERSION LAYERS; MOS DEVICES; ROUGH SURFACES;

EID: 0021640291     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/iedm.1984.190794     Document Type: Conference Paper

References (0)