ENDURANCE MODEL FOR TEXTURED-POLY FLOATING GATE MEMORIES.

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1984, Pages 480-483

  Wegener, H A Richard ^a  

^a Xicor Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS;

FLOATING GATE MEMORIES;

DATA STORAGE, SEMICONDUCTOR;

FLOATING GATE MEMORIES;

EID: 0021640250     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/iedm.1984.190756     Document Type: Conference Paper

References (12)