LOW VOLTAGE HOT-ELECTRON EFFECTS IN SHORT CHANNEL MOSFETS.

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1984, Pages 92-95

  Ricco, B ^a   Sangiorgi, E ^a   Cantarelli, D ^a  

^a UNIVERSITY OF BOLOGNA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

TRANSISTORS, FIELD EFFECT;

AUGER RECOMBINATION; CRITICAL CHANNEL REGION; INTERFACIAL BARRIER; LOW-VOLTAGE HOT-ELECTRON EFFECTS; SHORT CHANNEL MOSFET;

SEMICONDUCTOR DEVICES, MOSFET;

AUGER RECOMBINATION; CRITICAL CHANNEL REGION; INTERFACIAL BARRIER; LOW-VOLTAGE HOT-ELECTRON EFFECTS; SHORT CHANNEL MOSFET;

EID: 0021640153     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/iedm.1984.190650     Document Type: Conference Paper

References (12)