ANALYSIS OF THE MULTIPLE FAULT DETECTION CAPABILITIES OF SINGLE STUCK-AT FAULT TEST SETS.

Volumn , Issue , 1984, Pages 52-58

  Hughes, Joseph L A ^a   McCluskey, Edward J ^a  

^a Palo Alto Institute for Research and Education   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR DEVICE TESTING;

FAULT SIMULATION; MULTIPLE FAULT DETECTION; SINGLE STUCK-AT FAULT TEST SETS;

INTEGRATED CIRCUITS;

EID: 0021631892     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (20)