RANDOM PETURBATION METHOD FOR IC YIELD OPTIMIZATION WITH DETERMINISTIC PROCESS PARAMETERS.

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn 3, Issue , 1984, Pages 977-980

  Styblinski, M A ^a   Opalski, L J ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DETERMINISTIC PROCESS PARAMETERS; RANDOM PERTURBATIONS; STANDARD STATISTICAL METHODS; STATISTICAL DESIGN CENTERING; STOCHASTIC APPROXIMATION; YIELD OPTIMIZATION;

INTEGRATED CIRCUITS;

EID: 0021630587     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)