STRUCTURAL STUDIES OF SPUTTERED MoS//2 FILMS BY ANGLE-RESOLVED PHOTOELECTRON SPECTROSCOPY.

ASLE Special Publication

Volumn , Issue , 1984, Pages 223-229

  Fleischauer, Paul D ^a   Tolentino, Lucio U ^a  

^a AEROSPACE CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FILMS - SPECTROSCOPIC ANALYSIS; SPECTROSCOPY, AUGER ELECTRON - APPLICATIONS; TRIBOLOGY;

ANGLE-RESOLVED SPECTRA; ANGULAR DISTRIBUTION STUDIES; SPUTTERED FILMS ORIENTATION; SULFUR ATOM LAYERING; TRIBOLOGICAL PROPERTIES; ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY;

PROTECTIVE COATINGS;

EID: 0021619290     PISSN: 01988514     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)