CALIBRATION METHODS FOR MICROWAVE WAFER PROBING.

IEEE MTT-S International Microwave Symposium Digest

Volumn , Issue , 1984, Pages 93-97

  Strid, Eric W ^a   Gleason, K Reed ^a  

^a TEKTRONIX INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC MEASUREMENTS - IMPEDANCE; INTEGRATED CIRCUIT TESTING - COMPONENTS; MEASUREMENTS - STANDARDS;

MICROWAVE WAFER PROBING; ON-WAFER CALIBRATION; ON-WAFER IMPEDANCE STANDARDS; RADIATION LOSSES;

INTEGRATED CIRCUITS, MONOLITHIC;

EID: 0021615364     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)