PARALLEL PSEUDORANDOM SEQUENCES FOR BUILT-IN TEST.

Volumn , Issue , 1984, Pages 302-308

  Bardell, P H ^a   McAnney, W H ^a  

^a IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL TECHNIQUES - POLYNOMIALS;

BUILT-IN TESTS; LINEAR FEEDBACK SHIFT REGISTER; PARALLEL PSEUDORANDOM SEQUENCES;

INTEGRATED CIRCUITS, VLSI;

EID: 0021606781     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)