SYSTEMATIC UNCERTAINTIES IN THE DETERMINATION OF THE LATTICE SPACING d(220) IN SILICON.

National Bureau of Standards, Special Publication

Volumn , Issue , 1984, Pages 321-324

  Siegert, H ^a   Becker, P ^a  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTING SILICON;

LATTICE SPACING; PRECISION LENGTH MEASUREMENT; SYSTEMATIC UNCERTAINTIES;

CRYSTALS;

EID: 0021606765     PISSN: 00831883     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)