The Single Event Upset (SEU) Response to 590 MEV Protons

IEEE Transactions on Nuclear Science

Volumn 31, Issue 6, 1984, Pages 1565-1567

  Nichols, D K ^a   Price, W E ^a   Smith, L S ^a   Soli, G A ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COSMIC RAYS; EARTH ATMOSPHERE - RADIATION BELTS; PROTONS; RADIATION EFFECTS - TESTING; SOLAR RADIATION;

HIGH-ENERGY PROTONS; NUCLEAR REACTION PRODUCTS; SINGLE EVENT UPSET;

SEMICONDUCTOR DEVICES;

EID: 0021605306     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1984.4333550     Document Type: Article

References (5)

1. D. K. Nichols, W. E. Price, and J. L. Andrews, “The Dependence of Single Event Upset on Proton Energy (15–590 MeV)”, IEEE Trans on Nuc. Sci., NS-29, No. 6, (December, 1982), p. 2081.
2. W. L. Bendel and E. L. Petersen, “Proton Upsets in Orbit”, IEEE Trans. on Nuc. Sci., NS-30, No. 6, (December, 1983), p. 4481.
3. Tom Jordan, JPL, private communication.
4. P. J. McNulty, G. E. Farrell, and W. P. Tucker, “Proton-Induced Nuclear Reactions in Silicon”, IEEE Trans. on Nuc. Sci., NS-28, No. 6, (December, 1981), p. 4007. NS-28.
5. E. L. Petersen, J. B. Langworthy, S. E. Diehl, “Suggested Single Event Upset Figure of Merit”, IEEE Trans. on Nuc. Sci., NS-30, No. 6, (December 1983), p. 4533. NS-30.