Single Event Upset Testing with Relativisticheavy Ions

IEEE Transactions on Nuclear Science

Volumn 31, Issue 6, 1984, Pages 1559-1561

  Criswell, T L ^a   Measel, P R ^a   Wahlin, K L ^a  

^a BOEING COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COSMIC RAYS; DATA STORAGE, DIGITAL - RANDOM ACCESS; DATA STORAGE, SEMICONDUCTOR - STORAGE DEVICES; IONS; RADIATION EFFECTS - TESTING;

ARGON ION BEAMS; IRON ION BEAMS; NEON ION BEAMS; RELATIVISTIC HEAVY IONS; SINGLE EVENT UPSET TESTING;

COMPUTERS, MICROPROCESSOR;

EID: 0021605305     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1984.4333548     Document Type: Article

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