STATISTICAL ANALYSIS OF DIGITAL CIRCUITS SUBJECTED TO EMI INDUCED DELAYS.

Volumn , Issue , 1984, Pages 145-

  Ephrath, Abner ^a   Weiner, Donald ^a   Capraro, Gerard ^a  

^a SYRACUSE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMBINATIONAL LOGIC CIRCUITS; ELECTROMAGNETIC INTERFERENCE (EMI); EMI INDUCED DELAYS; STATISTICAL ANALYSIS; SUMMARY ONLY; TTL NAND GATE;

INTEGRATED CIRCUITS, DIGITAL;

EID: 0021601905     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)