SOFT-ERROR GENERATION DUE TO HEAVY-ION TRACKS IN BIPOLAR INTEGRATED CIRCUITS.

Conference on Solid State Devices and Materials

Volumn , Issue , 1984, Pages 249-251

  Zoutendyk, J A ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR DEVICES, BIPOLAR;

BIPOLAR INTEGRATED CIRCUITS; HEAVY ION TRACKS; HIGH DENSITY LSI/VLSI TECHNOLOGY; SOFT-ERROR GENERATION;

INTEGRATED CIRCUITS, VLSI;

EID: 0021588681     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.7567/ssdm.1984.a-6-4     Document Type: Conference Paper

References (2)