Full-Speed Testing of A/D Converters

IEEE Journal of Solid-State Circuits

Volumn 19, Issue 6, 1984, Pages 820-827

  Doernberg, Joey ^a   Hodges, David A ^a   Lee, Hae Seung ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CODES, SYMBOLIC; SPECTRUM ANALYSIS;

COMPUTER-AIDED ADC CHARACTERIZATION METHOD; DIGITAL OUTPUT CODES; FULL-SPEED TESTING;

DATA CONVERSION, ANALOG TO DIGITAL;

EID: 0021586344     PISSN: 00189200     EISSN: 1558173X     Source Type: Journal    
DOI: 10.1109/JSSC.1984.1052232     Document Type: Article

References (6)

1. “Dynamic performance testing of A to D converters,” Hewlett Packard Product Note 5180A-2.
2. R. A. Belcher, “Audio non-linearity: An initial appraisal of a double comb-filter method of measurement,” BBC Res. Dep., Rep., 1977/40, Nov. 1977.
3. H. Murveit, “An integrated-circuit based speech recognition system,” Ph.D. dissertation, Univ. of California, Berkeley, Dec. 1983.
4. W. A. Kester, “Characterizing and testing A/D and D/A converters for color video applications,” IEEE Trans. Circuits Syst., vol. CAS-25, pp. 539–549, July 1978.
5. F. J. Harris, “On the use of windows for harmonic analysis with the discrete Fourier transform,” Proc. IEEE, vol. 66, Jan. 1978.
6. J. J. Corcoran, T. Homak, and P. B. Skov, “A high-resolution error plotter for analog-to-digital converters,” IEEE Trans. Instrum. Meas., vol. IM-24, Dec. 1975.