Charge collection in Ga/As test structures

IEEE Transactions on Nuclear Science

Volumn 31, Issue 6, 1984, Pages 1128-1131

  Roosild, S ^d   Knudson, A R ^b   Shapiro, P ^b  

^a CLARKSON UNIVERSITY   (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

^c Rockwell International   (United States)

^d DEFENSE ADVANCED RESEARCH PROJECTS AGENCY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

RADIATION EFFECTS; SEMICONDUCTING GALLIUM ARSENIDE;

CHARGE COLLECTION; LARGE-AREA TEST STRUCTURES; SINGLE-EVENT UPSETS;

DATA STORAGE, SEMICONDUCTOR;

EID: 0021582906     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1984.4333469     Document Type: Article

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