ON TESTABILITY ANALYSIS OF COMBINATIONAL NETWORKS.

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn 1, Issue , 1984, Pages 221-225

  Brglez, Franc ^a  

^a NORTEL NETWORKS   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC CIRCUITS, DIGITAL;

DESIGN FOR TESTABILITY; FAULT COVERAGE; LARGE COMBINATIONAL MODULES; TEST PATTERN EFFECTIVENESS; TEST PATTERN GENERATION; TESTABILITY ALGORITHMS;

LOGIC CIRCUITS, COMBINATORIAL;

EID: 0021582621     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)