Importance of attachment cross-sections of F- formation for the effective ionisation coefficients in SF6

Journal of Physics D: Applied Physics

Volumn 17, Issue 11, 1984, Pages 2215-2223

  Hayashi, M ^a   Nimura, T ^a  

^a NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BOLTZMANN EQUATION; SULFUR HEXAFLUORIDE;

GASES;

EID: 0021531880     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/17/11/008     Document Type: Article

References (36)

1. Total cross section of the SF6 molecule for elastic electron scattering
2. Cross Sections for Electron Attachment Resonances Peaking at Subthermal Energies
3. Total cross section measurement for e-SF6scattering down to 0.036 eV
4. An Annotated Compilation and Appraisal of Electron Swarm Data in Electronegative Gases
5. Breakdown field strength of SF6, N2O, SF6+N2, and SF6+N2O
6. Identification and Mobility of Ions in a Townsend Discharge by Time-resolved Mass Spectrometry
7. Distribution of ionisation fractions in irradiated targets
8. Absolute differential cross sections for e-SF6scattering in the a1gand t1uresonance region