Configuration of VLSI Arrays in the Presence of Defects

Journal of the ACM (JACM)

Volumn 31, Issue 4, 1984, Pages 694-717

  Greene, Jonathan W ^a   El Gamal, Abbas ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT MANUFACTURE;

PROPAGATION DELAY; VLSI; YIELD ENHANCEMENT;

INTEGRATED CIRCUITS, VLSI;

EID: 0021508867     PISSN: 00045411     EISSN: 1557735X     Source Type: Journal    
DOI: 10.1145/1634.2377     Document Type: Article

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