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Volumn 31, Issue 9, 1984, Pages 1324-1328

Analysis of Charge-Priming Transfer Efficiency in CPD Image Sensors

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR DEVICES; SENSORS;

EID: 0021483361     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1984.21707     Document Type: Article
Times cited : (15)

References (10)
  • 3
    • 0020303927 scopus 로고
    • Blooming characteristics of solid-state imager overlaid with a photoconductor
    • T. Chikamura, Y. Miyata, Y. Ohta, S. Fujiwara, and M. Fukai, “Blooming characteristics of solid-state imager overlaid with a photoconductor,” IEEE Trans. Electron Devices, vol. ED-29, pp. 1857–1862, 1982.
    • (1982) IEEE Trans. Electron Devices , vol.ED-29 , pp. 1857-1862
    • Chikamura, T.1    Miyata, Y.2    Ohta, Y.3    Fujiwara, S.4    Fukai, M.5
  • 6
    • 0019019403 scopus 로고
    • A new organization area image sensor with CCD readout through charge priming transfer
    • S. Terakawa, T. Yamada, K. Horii, T. Takamura, and I. Teramoto, “A new organization area image sensor with CCD readout through charge priming transfer,” IEEE Electron Device Lett., vol. EDL-1, pp. 86–88, 1980.
    • (1980) IEEE Electron Device Lett. , vol.EDL-1 , pp. 86-88
    • Terakawa, S.1    Yamada, T.2    Horii, K.3    Takamura, T.4    Teramoto, I.5
  • 9
    • 0015376030 scopus 로고
    • Performance limitations of the IGFET bucket-brigade shift register
    • C. N. Berglund and H. J. Boll, “Performance limitations of the IGFET bucket-brigade shift register,” IEEE Trans. Electron Devices, vol. ED-19, pp. 852–860, 1972.
    • (1972) IEEE Trans. Electron Devices , vol.ED-19 , pp. 852-860
    • Berglund, C.N.1    Boll, H.J.2
  • 10
    • 0015584735 scopus 로고
    • A fundamental comparison of incomplete charge transfer in charge transfer device
    • C. N. Berglund and K. K. Thornber, “A fundamental comparison of incomplete charge transfer in charge transfer device,” Bell System Tech. J. vol. 52, pp. 147–182, 1973.
    • (1973) Bell System Tech. J. , vol.52 , pp. 147-182
    • Berglund, C.N.1    Thornber, K.K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.