Lucky-Electron Model of Channel Hot-Electron Injection in MOSFET's

IEEE Transactions on Electron Devices

Volumn 31, Issue 9, 1984, Pages 1116-1125

  Ko, Ping Keung ^a   Hu, Chenming ^a   Tam, Simon ^b  

^a INTEL CORPORATION   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONS;

CHANNEL HOT-ELECTRON INJECTION; LUCKY-ELECTRON MODEL; N-CHANNEL MOSFETS;

SEMICONDUCTOR DEVICES, MOSFET;

EID: 0021483045     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1984.21674     Document Type: Article

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