ASPHERICAL SURFACE TESTING WITH SHEARING INTERFEROMETER USING FRINGE SCANNING DETECTION METHOD.

Optical Engineering

Volumn 23, Issue 4, 1984, Pages 357-360

  Yatagai, Toyohiko ^a   Kanou, Toshio ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ASPHERICAL SURFACE TESTING; FRINGE SCANNING DETECTORS; SHEARING INTERFEROMETERS;

INTERFEROMETERS;

EID: 0021463793     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.7973300     Document Type: Article

References (14)