Multiple Resolution Texture Analysis and Classification

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn PAMI-6, Issue 4, 1984, Pages 518-523

  Peleg, Shmuel ^a   Naor, Joseph ^a   Hartley, Ralph ^b   Avnir, David ^a  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

^b UNIVERSITY OF MARYLAND   (United States)

Author keywords

fractal signature; Fractals; multiresolution methods; texture classification

Indexed keywords

FRACTAL SIGNATURE; MULTIRESOLUTION METHODS; TEXTURE ANALYSIS;

IMAGE PROCESSING;

EID: 0021455412     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPAMI.1984.4767557     Document Type: Article

References (11)

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11. P. Pfeifer, D. Avnir, and D. Farin, “Idealy irregular surfaces of dimension greater than two, in theory and practice,”Surface Sci., vol. 126, pp. 569-572,1983.