Characteristics of amorphous silicon staggered-electrode thin-film transistors

Applied Physics Letters

Volumn 45, Issue 2, 1984, Pages 171-173

  Powell, M J ^a   Orton, J W ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTING SILICON - THIN FILMS; SEMICONDUCTOR DEVICES - ELECTRODES;

AMORPHOUS SILICON; CURRENT CROWDING; STAGGERED ELECTRODE TRANSISTORS;

TRANSISTORS;

EID: 0021455295     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.95158     Document Type: Article

References (19)

1. Proceedings of Materials Research Society Symposium