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Volumn C-33, Issue 6, 1984, Pages 507-517

The Role of a Maintenance Processor for a General-Purpose Computer System

Author keywords

Availability; coverage; fault diagnosis; fault recovery; fault tolerance; maintenance processor; reconfiguration; reliability; serviceability

Indexed keywords

COMPUTER SYSTEMS, DIGITAL;

EID: 0021439221     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/TC.1984.1676474     Document Type: Article
Times cited : (12)

References (21)
  • 1
    • 0019611632 scopus 로고
    • Reliability, availability, and serviceability of IBM computer systems: A quarter century of progress
    • M.Y. Hsiao, W.C. Carter, J.W. Thomas, and W. R. Stringfellow, “Reliability, availability, and serviceability of IBM computer systems: A quarter century of progress,” IBM J. Res. Devel., vol. 25, pp. 453–465, Sept. 1981.
    • (1981) IBM J. Res. Devel. , vol.25 , pp. 453-465
    • Hsiao, M.Y.1    Carter, W.C.2    Thomas, J.W.3    Stringfellow, W.R.4
  • 2
    • 0004156364 scopus 로고
    • Error Detecting Logic for Digital Computers
    • New York: McGraw-Hill
    • F. F. Sellers, M. Y. Hsiao, and L. W. Beamson, Error Detecting Logic for Digital Computers. New York: McGraw-Hill, 1968.
    • (1968)
    • Sellers, F.F.1    Hsiao, M.Y.2    Beamson, L.W.3
  • 3
    • 0018028341 scopus 로고
    • Fault-tolerance: The survival attribute of digital systems
    • A. Avizienis, “Fault-tolerance: The survival attribute of digital systems,” Proc. IEEE, vol. 66, pp. 1109–1125, Oct. 1978.
    • (1978) Proc. IEEE , vol.66 , pp. 1109-1125
    • Avizienis, A.1
  • 4
    • 0017982984 scopus 로고
    • Recovery techniques for database systems
    • J. S. M. Verhofstad, “Recovery techniques for database systems,” Corn-put. Surveys, vol. 10, pp. 167–195, June 1978.
    • (1978) Corn-put. Surveys , vol.10 , pp. 167-195
    • Verhofstad, J.S.M.1
  • 6
    • 84944989576 scopus 로고
    • Honeywell Distributed Processing System 88: Summary Description
    • Honeywell Distributed Processing System 88: Summary Description, Market Document DN 92–00, Oct. 1982.
    • (1982) Market Document DN
  • 7
    • 0019266270 scopus 로고
    • Availability, reliability and maintainability aspects of the Sperry Univac 1100/60
    • Kyoto, Japan
    • L. A. Boone, H. Liebergot, and R. Sedmak, “Availability, reliability and maintainability aspects of the Sperry Univac 1100/60,” in Proc. 10th Int. Symp. Fault-Tolerant Computing, Kyoto, Japan, Oct. 1980, 3–8.
    • (1980) Proc. 10th Int. Symp. Fault-Tolerant Computing , pp. 3-8
    • Boone, L.A.1    Liebergot, H.2    Sedmak, R.3
  • 9
    • 0018051819 scopus 로고
    • Reliability and maintainability enhancements for the VAX-11/780
    • Toulouse, France
    • R.S. Swartz, “Reliability and maintainability enhancements for the VAX-11/780,” in Proc. 8th Annu. Int. Conf. Fault-Tolerant Computing, Toulouse, France, June 1978, pp. 24–28.
    • (1978) Proc. 8th Annu. Int. Conf. Fault-Tolerant Computing , pp. 24-28
    • Swartz, R.S.1
  • 10
    • 0019710247 scopus 로고
    • Fault tolerance by means of external monitoring of computer systems
    • [10] A. Avizienis, “Fault tolerance by means of external monitoring of computer systems,” in Proc. Nat. Comput. Conf., 1981, pp. 27–40.
    • (1981) Proc. Nat. Comput. Conf. , pp. 27-40
    • Avizienis, A.1
  • 11
    • 84944989577 scopus 로고
    • Honeywell DPS 8 Customer Services Division: Summary Description
    • Honeywell DPS 8 Customer Services Division: Summary Description, Market Document DP89-00, Aug. 1982.
    • (1982) Market Document DP 8900
  • 12
    • 84944980126 scopus 로고
    • Technology of 83: Minis and mainframes
    • E. Herbert, “Technology of 83: Minis and mainframes,” IEEE Spectrum, pp. 28–33, Jan. 1983.
    • (1983) IEEE Spectrum , pp. 28-33
    • Herbert, E.1
  • 13
    • 0020750385 scopus 로고
    • A fault-tolerant system architecture for Navy applications
    • W. T. Comfort, “A fault-tolerant system architecture for Navy applications,” IBM J. Res. Devel., vol. 27, pp. 219–236, May 1983.
    • (1983) IBM J. Res. Devel. , vol.27 , pp. 219-236
    • Comfort, W.T.1
  • 14
    • 0019910989 scopus 로고
    • IBM 3081 Processor Unit: Design considerations and design process
    • R. N. Gustafson and F. J. Sparacio, “IBM 3081 Processor Unit: Design considerations and design process,” IBM J. Res. Devel., vol. 26, pp. 12–21, Jan. 1982.
    • (1982) IBM J. Res. Devel. , vol.26 , pp. 12-21
    • Gustafson, R.N.1    Sparacio, F.J.2
  • 15
    • 0019899471 scopus 로고
    • Automated diagnostic methodology for the IBM 3081 Processor Complex
    • N. Tendolkar and R. Swann, “Automated diagnostic methodology for the IBM 3081 Processor Complex,” IBM J. Res. Devel., vol. 26, pp. 78–88, Jan. 1982.
    • (1982) IBM J. Res. Devel. , vol.26 , pp. 78-88
    • Tendolkar, N.1    Swann, R.2
  • 16
    • 0021371917 scopus 로고
    • Maintenance processors for mainframe computers
    • T. S. Liu, “Maintenance processors for mainframe computers,” IEEE Spectrum, pp. 36–42, Feb. 1984.
    • (1984) IEEE Spectrum , pp. 36-42
    • Liu, T.S.1
  • 17
    • 0004257011 scopus 로고
    • Mathematical Theory of Reliability
    • New York
    • R.E. Barlow and F. Proschan, Mathematical Theory of Reliability. New York: 1967, ch. 5.
    • (1967)
    • Barlow, R.E.1    Proschan, F.2
  • 18
    • 0003979966 scopus 로고
    • Finite Markov Chains
    • Princeton, NJ: Van Nostrand
    • J.G. Kemeny and J.L. Snell, Finite Markov Chains. Princeton, NJ: Van Nostrand, 1960, ch. III.
    • (1960)
    • Kemeny, J.G.1    Snell, J.L.2
  • 19
    • 0020151687 scopus 로고
    • Derivation and calibration of a transient error reliability model
    • X. Castillo, S.R. McConnell, and D. P. Siewiorek, “Derivation and calibration of a transient error reliability model,” IEEE Trans. Comput., vol. C-31, pp. 658–671, July 1982.
    • (1982) IEEE Trans. Comput. , vol.C-31 , pp. 658-671
    • Castillo, X.1    McConnell, S.R.2    Siewiorek, D.P.3
  • 21
    • 0015603505 scopus 로고
    • The concept of coverage and its effect on the reliability model of a repairable system
    • T. Arnold, “The concept of coverage and its effect on the reliability model of a repairable system,” IEEE Trans. Comput., vol. C-22, pp. 251–254, Mar. 1973.
    • (1973) IEEE Trans. Comput. , vol.C-22 , pp. 251-254
    • Arnold, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.