Generalized Scaling Theory and Its Application to a 1/4 micrometer MOSFET Design

IEEE Transactions on Electron Devices

Volumn 31, Issue 4, 1984, Pages 452-462

  Dennard, Robert H ^a   Wordeman, Matthew R ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR DEVICES, MOSFET;

EID: 0021406605     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1984.21550     Document Type: Article

References (41)

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