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Journal of Applied Physics

Volumn 55, Issue 8, 1984, Pages 3000-3019

Enhanced conduction and minimized charge trapping in electrically alterable read-only memories using off-stoichiometric silicon dioxide films

(5) DiMaria, D J a Dong, D W a Pesavento, F L a Lam, C b Brorson, S D c

a IBM T J WATSON RESEARCH CENTER (United States)

b IBM (United States)

c MASSACHUSETTS INSTITUTE OF TECHNOLOGY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTING SILICON COMPOUNDS;

EID: 0021405389 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.333291 Document Type: Article

Times cited : (39)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.