Subaperture testing approaches: A comparison

Applied Optics

Volumn 23, Issue 5, 1984, Pages 740-745

  Jensen, Stephen C ^a   Chow, Weng W ^a   Lawrence, George N ^a  

^a UNIVERSITY OF NEW MEXICO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICS;

EID: 0021389877     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.23.000740     Document Type: Article

References (7)

1. O. Y. Kwon and J. G. Thunen, LODE: Subaperture Optical Testing, Lockheed Missies and Space Co. LMSC-D811929 (6 Nov. 1981).
2. J. G. Thunen and O. Y. Kwon, Proc. Soc. Photo-Opt. Instrum. Eng. 351 (1982).
3. W. W. Chow and G. N. Lawrence, Opt. Lett. 8, 468 (1983).
4. W. W. Chow and G. N. Lawrence, Proc. Soc. Photo-Opt. Instrum. Eng. 440 (1983).
5. F. Zernike, Physica 1, 689 (1934)
6. M. Born and E. Wolf, Principles of Optics (Pergamon, Oxford, 1980), pp. 464-468.
7. J. E. Negro et al., LBET III Final Technical Report, Charles Stark Draper Laboratory CSDL-R-1580, ARPA 3679 (Aug. 1982).