A Reliable Approach to Charge-Pumping Measurements in MOS Transistors

IEEE Transactions on Electron Devices

Volumn 31, Issue 1, 1984, Pages 42-53

  Groeseneken, Guido ^a   Maes, Herman E ^a   Beltran, Nicolas ^a   De Keersmaecker, Roger F ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR DEVICES, MOS;

TRANSISTORS;

EID: 0021201529     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1984.21472     Document Type: Article

References (23)

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