ROBUST TESTS FOR STUCK-OPEN FAULTS IN CMOS COMBINATIONAL LOGIC CIRCUITS.

Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)

Volumn , Issue , 1984, Pages 44-49

  Reddy, Sudhakar M ^a   Reddy, Madhukar K ^a   Agawal, Vishwani D ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

CMOS COMBINATIONAL LOGIC CIRCUITS; INPUT CHANGES; STUCK-OPEN FAULTS TESTING; TIMING SKEWS;

LOGIC CIRCUITS, COMBINATORIAL;

EID: 0021199436     PISSN: 07313071     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)