FAULT COVERAGE OF PSEUDO-EXHAUSTIVE TESTING.

Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)

Volumn , Issue , 1984, Pages 141-145

  Archambeau, Eric C ^a   McCluskey, Edward J ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT SEGMENTATION; FAULT COVERAGE TESTING EVALUATION; FAULT DETECTION; PSEUDO-EXHAUSTIVE TESTING DEFINITION; TEST PATTERN GENERATION;

LOGIC CIRCUITS;

EID: 0021197958     PISSN: 07313071     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)