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Volumn 105, Issue 1, 1983, Pages 75-96

Carbon films: Structure and microtexture (optical and electron microscopy, Raman spectroscopy)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS - STRUCTURE; FILMS - MICROSCOPIC EXAMINATION; GRAPHITE; SPECTROSCOPY, RAMAN;

EID: 0021097609     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(83)90333-4     Document Type: Article
Times cited : (213)

References (31)
  • 26
    • 84975541790 scopus 로고
    • Computational Method for Determining n and k for a Thin Film from the Measured Reflectance, Transmittance, and Film Thickness
    • (1966) Applied Optics , vol.5 , pp. 41
    • Bennett1    Booty2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.