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Volumn , Issue , 1983, Pages 176-181
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HOT-ELECTRON EFFECTS IN MOSFET'S.
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NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
BIAS VOLTAGE DEPENDENCE;
CORRELATIONS AMONG HOT ELECTRON CURRENTS;
ELECTRON TEMPERATURE VERSUS FIELD;
IMPACT ON IC PERFORMANCE AND RELIABILITY;
PHYSICS OF HOT ELECTRON CURRENTS;
SIMPLE MODEL OF CHANNEL FIELD;
SEMICONDUCTOR DEVICES, MOSFET;
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EID: 0020952509
PISSN: 01631918
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (77)
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References (0)
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