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Volumn 30, Issue 6, 1983, Pages 4064-4070

Thermally stimulated current measurements on Irradiated mos capacitors

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC MEASUREMENTS; SEMICONDUCTOR DEVICES, MOS - RADIATION EFFECTS; THERMAL EFFECTS;

EID: 0020936765     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1983.4333082     Document Type: Article
Times cited : (33)

References (32)
  • 1
    • 0038766059 scopus 로고
    • Electronics
    • H.L. Hughes and R.A. Giroux, Electronics 37, 58 (1964).
    • (1964) , vol.37 , pp. 58
    • Hughes, H.L.1    Giroux, R.A.2
  • 4
    • 84939031184 scopus 로고    scopus 로고
    • Final Report, RADC TR-81-113 July
    • J.M. Aitken, Final Report, RADC TR-81-113 (July 49–64.
    • Aitken, J.M.1
  • 8
    • 84939002643 scopus 로고
    • Final Report, HDL-CR-79-159-1, Nov.
    • G.W. Hughes and J.H. Thomas III, Final Report, HDL-CR-79-159-1, Nov. 1981.
    • (1981)
    • Hughes, G.W.1    Thomas, J.H.2
  • 9
    • 84956243677 scopus 로고
    • Physica Scripta
    • M. Bakowski, Physica Scripta 24, 410 (1981).
    • (1981) , vol.24 , pp. 410
    • Bakowski, M.1
  • 25
    • 84939062231 scopus 로고    scopus 로고
    • private communication
    • J. Maserjian, private communication.
    • Maserjian, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.