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Volumn 30, Issue 6, 1983, Pages 4064-4070
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Thermally stimulated current measurements on Irradiated mos capacitors
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC MEASUREMENTS;
SEMICONDUCTOR DEVICES, MOS - RADIATION EFFECTS;
THERMAL EFFECTS;
CAPACITORS;
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EID: 0020936765
PISSN: 00189499
EISSN: 15581578
Source Type: Journal
DOI: 10.1109/TNS.1983.4333082 Document Type: Article |
Times cited : (33)
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References (32)
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