Exhaustive Test Pattern Generation with Constant Weight Vectors

IEEE Transactions on Computers

Volumn C-32, Issue 12, 1983, Pages 1145-1150

  Tang, Donald T ^a   Woo, Lin S ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

Constant weight codes; exhaustive testing; fault testing; logic testing; multilevel logic; scan path; self testing; test pattern generation; VLSI testing

Indexed keywords

LOGIC CIRCUITS;

EID: 0020929233     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/TC.1983.1676175     Document Type: Article

References (9)

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