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Volumn 30, Issue 12, 1983, Pages 1619-1623

Barrier-Limited Transport in Semiconductor Devices

Author keywords

[No Author keywords available]

Indexed keywords

IONS - TRANSPORT PROPERTIES;

EID: 0020924006     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1983.21421     Document Type: Article
Times cited : (17)

References (14)
  • 1
    • 0017943041 scopus 로고
    • Subthreshold conduction in MOSFET's
    • Mar.
    • G. W. Taylor, “Subthreshold conduction in MOSFET's,” IEEE Trans. Electron Devices, vol. ED-25, pp. 337-350, Mar. 1978.
    • (1978) IEEE Trans. Electron Devices , vol.ED-25 , pp. 337-350
    • Taylor, G.W.1
  • 2
    • 0019022397 scopus 로고
    • Fabrication and numerical simulation of the permeable base transistor
    • June
    • C. O. Bozler and G. D. Alley, “Fabrication and numerical simulation of the permeable base transistor,” IEEE Trans. Electron Devices, vol. ED-27, pp. 1128-1141, June 1980.
    • (1980) IEEE Trans. Electron Devices , vol.ED-27 , pp. 1128-1141
    • Bozler, C.O.1    Alley, G.D.2
  • 3
    • 0018545753 scopus 로고
    • Ballistic transport in semiconductor at low temperatures for low-power high-speed logic
    • Nov.
    • M. S. Shur and L. F. Eastman, “Ballistic transport in semiconductor at low temperatures for low-power high-speed logic,” IEEE Trans. Electron Devices, vol. ED-26, pp. 1677-1683, Nov. 1979.
    • (1979) IEEE Trans. Electron Devices , vol.ED-26 , pp. 1677-1683
    • Shur, M.S.1    Eastman, L.F.2
  • 4
    • 0041931425 scopus 로고
    • Thermionic emission
    • Oct.
    • S. Dushman, “Thermionic emission,” Rev. Mod. Phys., vol. 2, pp. 381-476, Oct. 1930.
    • (1930) Rev. Mod. Phys. , vol.2 , pp. 381-476
    • Dushman, S.1
  • 7
    • 84942209977 scopus 로고
    • The theory of direct-current characteristics of rectifiers
    • P. T. Landsberg, “The theory of direct-current characteristics of rectifiers,” in Proc. Roy. Soc. London, Ser. A, vol. 206, pp. 463-447, 1951.
    • (1951) Proc. Roy. Soc. London, Ser. A , vol.206 , pp. 447-463
    • Landsberg, P.T.1
  • 10
    • 0019041859 scopus 로고
    • High-frequency effects of ballistic transport in semiconductors
    • W. R. Frensley, “High-frequency effects of ballistic transport in semiconductors,” IEEE Electron Device Lett., vol. EDL-1, pp. 137-139, 1980.
    • (1980) IEEE Electron Device Lett. , vol.EDL-1 , pp. 137-139
    • Frensley, W.R.1
  • 11
    • 0019606795 scopus 로고
    • Diffusion effects and ‘ballistic transport’
    • Aug.
    • R. K. Cook and J. Frey, “Diffusion effects and ‘ballistic transport’,” IEEE Trans. Electron Devices, vol. ED-28, pp. 951-953, Aug. 1981.
    • (1981) IEEE Trans. Electron Devices , vol.ED-28 , pp. 951-953
    • Cook, R.K.1    Frey, J.2
  • 12
    • 0000766947 scopus 로고
    • Current transport in metal-semiconductor barriers
    • C. R. Crowell and S. M. Sze, “Current transport in metal-semiconductor barriers,” Solid-State Electron., vol. 9, pp. 1035-1048, 1966.
    • (1966) Solid-State Electron. , vol.9 , pp. 1035-1048
    • Crowell, C.R.1    Sze, S.M.2
  • 13
    • 0014705867 scopus 로고
    • Transport equations for electrons in two-valley semiconductors
    • Jan.
    • K. Blotekjaer, “Transport equations for electrons in two-valley semiconductors,” IEEE Trans. Electron Devices, vol. ED-17, pp. 38-47, Jan. 1970.
    • (1970) IEEE Trans. Electron Devices , vol.ED-17 , pp. 38-47
    • Blotekjaer, K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.