Memory system design for tolerating single event upsets

IEEE Transactions on Nuclear Science

Volumn 30, Issue 6, 1983, Pages 4339-4344

  Abraham, Jacob A ^a   Davidson, Edward S ^a   Patel, Janak H ^a  

^a Illinois Computer Research Inc ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA STORAGE, DIGITAL;

EID: 0020916561     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1983.4333134     Document Type: Article

References (17)

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