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Volumn , Issue , 1983, Pages 152-153

METHODOLOGY FOR WORST CASE DESIGN OF INTEGRATED CIRCUITS.

Author keywords

[No Author keywords available]

Indexed keywords

DEVICE PERFORMANCES; DIGEST OF PAPER; ESTIMATES OF VARIATIONS; FORMAL APPROACH TO WORST CASE DESIGN; STATISTICAL PROCESS SIMULATOR; STATISTICALLY INDEPENDENT PROCESS DISTURBANCES;

EID: 0020912029     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (10)

References (0)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.