|
Volumn , Issue , 1983, Pages 152-153
|
METHODOLOGY FOR WORST CASE DESIGN OF INTEGRATED CIRCUITS.
a a a
a
NONE
|
Author keywords
[No Author keywords available]
|
Indexed keywords
DEVICE PERFORMANCES;
DIGEST OF PAPER;
ESTIMATES OF VARIATIONS;
FORMAL APPROACH TO WORST CASE DESIGN;
STATISTICAL PROCESS SIMULATOR;
STATISTICALLY INDEPENDENT PROCESS DISTURBANCES;
INTEGRATED CIRCUITS;
|
EID: 0020912029
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (10)
|
References (0)
|