DEVICE PERFORMANCE DEGRADATION DUE TO HOT-CARRIER INJECTION AT ENERGIES BELOW THE Si-SiO//2 ENERGY BARRIER.

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1983, Pages 396-399

  Takeda, Eiji ^a   Suzuki, Norio ^a   Hagiwara, Takaaki ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

DEVICE DEGRADATION; DEVICE PREPARATION; EMPIRICAL MODELING; HOT-CARRIER INJECTION MECHANISM; TRANSCONDUCTANCE DEGRADATION;

SEMICONDUCTOR DEVICES;

EID: 0020904903     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)