Comparison of 60Co response and 10 kev x-ray response in mos capacitors

IEEE Transactions on Nuclear Science

Volumn 30, Issue 6, 1983, Pages 4377-4381

  Oldham, T R ^a   McGarrity, J M ^a  

^a US Army Research Development and Engineering Command   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GAMMA RAYS; SEMICONDUCTOR DEVICES, MOS - RADIATION EFFECTS; X-RAYS;

CAPACITORS;

EID: 0020890075     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1983.4333141     Document Type: Article

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