ALUMINUM ELECTROMIGRATION UNDER PULSED dc CONDITIONS.

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1983, Pages 36-39

  Towner, Janet M ^a   van de Ven, Evert P ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM ELECTROMIGRATION UNDER PULSED DC CONDITIONS; ALUMINUM THIN FILMS; CONDUCTOR LIFETIME; ELECTROMIGRATION FAILURE; MEAN TIME TO FAILURE (MTF);

INTEGRATED CIRCUITS, VLSI;

EID: 0020880770     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)