TIME DISTRIBUTION OF INTERMITTENTS VERSUS CONTACT RESISTANCE FOR TIN-TIN CONNECTOR INTERFACES DURING LOW AMPLITUDE MOTION.

Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts

Volumn , Issue , 1983, Pages 55-59

  Abbott, W H ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE CRITERION FOR TESTING; HIGH SPEED DIGITAL CIRCUITS; INTERFACE MOTION; SEPARABLE CONNECTOR DEGRADATION; SHORT DURATION DYNAMICS; STATIC CONTACT RESISTANCE INCREASE;

ELECTRIC CONNECTORS;

EID: 0020880147     PISSN: 03614395     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)