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Volumn , Issue , 1983, Pages
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PRACTICAL SURFACE ANALYSIS BY AUGER AND X-RAY PHOTOELECTRON SPECTROSCOPY.
[No Author Info available]
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRON BEAMS;
ION SOURCES;
SPECTROSCOPIC ANALYSIS;
SPECTROSCOPY, AUGER ELECTRON - APPLICATIONS;
SPECTROSCOPY, X-RAY - APPLICATIONS;
MICROELECTRONICS;
SCANNING ELECTRON MICROSCOPY (SEM);
SURFACE TECHNIQUES;
ULTRA-HIGH VACUUM (UHV);
SURFACES;
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EID: 0020871436
PISSN: None
EISSN: None
Source Type: Book
DOI: None Document Type: Book |
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Times cited : (2353)
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References (0)
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