RADC FAILURE RATE PREDICTION METHODOLOGY - TODAY AND TOMORROW.

NATO ASI Series, Series F: Computer and Systems Sciences

Volumn , Issue 3, 1983, Pages 177-200

  Manno, Peter F ^a  

^a USAF   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS - RELIABILITY;

FAILURE RATE PREDICTION; MICROCIRCUIT RELIABILITY PREDICTION; MIL-HDBK-217D; RELIABILITY PREDICTION MODELS;

RELIABILITY THEORY;

EID: 0020864007     PISSN: 02581248     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1007/978-3-642-82014-4_11     Document Type: Conference Paper

References (17)