MODELING OF INTEGRATED CIRCUIT DEFECT SENSITIVITIES.

IBM Journal of Research and Development

Volumn 27, Issue 6, 1983, Pages 549-557

  Stapper, C H ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT MANUFACTURE;

EID: 0020846899     PISSN: 00188646     EISSN: None     Source Type: Journal    
DOI: 10.1147/rd.276.0549     Document Type: Article

References (13)